IMECH-IR  > 力学所知识产出(1956-2008)
Optical fringe multiplication technique with TEM nano-moiré method
Xie HM; Liu ZW; Fang DN; Dai FL; Xing YM; Zhao YP(赵亚溥)
Source PublicationMeasurement Science & Technology
2005
Volume16Issue:2Pages:529-534
ISSN0957-0233
AbstractIn this paper, a nano-moiré fringe multiplication method is proposed, which can be used to measure nano-deformation of single crystal materials. The lattice structure of Si (111) is recorded on a film at a given magnification under a transmission microscope, which acts as a specimen grating. A parallel grating (binary type) on glass or film is selected as a reference grating. A multiplied nano-moiré fringe pattern can be reproduced in a 4f optical filter system with the specimen grating and the prepared reference grating. The successful results illustrate that this method can be used to measure deformation in nanometre scale. The method is especially useful in the measurement of the inhomogeneous displacement field, and can be utilized to characterize nano-mechanical behaviour of materials such as dislocation and atomic bond failure.
Subject Area力学
DOI10.1088/0957-0233/16/2/027
Indexed BySCI
Language英语
WOS IDWOS:000227139700028
WOS Research AreaEngineering ; Instruments & Instrumentation
WOS SubjectEngineering, Multidisciplinary ; Instruments & Instrumentation
Citation statistics
Cited Times:5[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/16674
Collection力学所知识产出(1956-2008)
Recommended Citation
GB/T 7714
Xie HM,Liu ZW,Fang DN,et al. Optical fringe multiplication technique with TEM nano-moiré method[J]. Measurement Science & Technology,2005,16,2,:529-534.
APA Xie HM,Liu ZW,Fang DN,Dai FL,Xing YM,&赵亚溥.(2005).Optical fringe multiplication technique with TEM nano-moiré method.Measurement Science & Technology,16(2),529-534.
MLA Xie HM,et al."Optical fringe multiplication technique with TEM nano-moiré method".Measurement Science & Technology 16.2(2005):529-534.
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