IMECH-IR  > 力学所知识产出(1956-2008)
Peeling Experiments Of Ductile Thin Films Along Ceramic Substrates - Critical Assessment Of Analytical Models
Wei YG(魏悦广); Zhao HF(赵海峰); Wei, YG (reprint author), Chinese Acad Sci, Inst Mech, LNM, Beijing 100080, Peoples R China.
Source PublicationInternational Journal of Solids and Structures
2008
Pages3779-3792
ISSN0020-7683
AbstractTwo types of peeling experiments are performed in the present research. One is for the Al film/Al2O3 substrate system with an adhesive layer between the film and the substrate. The other one is for the Cu film/Al2O3 substrate system without adhesive layer between the film and the substrate, and the Cu films are electroplated onto the Al2O3 substrates. For the case with adhesive layer, two kinds of adhesives are selected, which are all the mixtures of epoxy and polyimide with mass ratios 1:1.5 and 1:1, respectively. The relationships between energy release rate, the film thickness and the adhesive layer thickness are measured during the steady-state peeling process. The effects of the adhesive layer on the energy release rate are analyzed. Using the experimental results, several analytical criteria for the steady-state peeling based on the bending model and on the two-dimensional finite element analysis model are critically assessed. Through assessment of analytical models, we find that the cohesive zone criterion based on the beam bend model is suitable for a weak interface strength case and it describes a macroscale fracture process zone case, while the two-dimensional finite element model is effective to both the strong interface and weak interface, and it describes a small-scale fracture process zone case. (C) 2007 Elsevier Ltd. All rights reserved.
KeywordPeel Experiment Metal Thin Film Analytical Model Interfacial Fracture Energy Pressure-sensitive Adhesive Strain Gradient Plasticity State Crack-growth Fracture Criterion Cantilever Beam Round-robin Work Toughness Strength Surface
DOI10.1016/j.ijsolstr.2007.10.023
Indexed BySCI ; EI
Language英语
WOS IDWOS:000256254800013
WOS KeywordPRESSURE-SENSITIVE ADHESIVE ; STRAIN GRADIENT PLASTICITY ; STATE CRACK-GROWTH ; FRACTURE CRITERION ; CANTILEVER BEAM ; ROUND-ROBIN ; WORK ; TOUGHNESS ; STRENGTH ; SURFACE
WOS Research AreaMechanics
WOS SubjectMechanics
Citation statistics
Cited Times:23[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/26024
Collection力学所知识产出(1956-2008)
Corresponding AuthorWei, YG (reprint author), Chinese Acad Sci, Inst Mech, LNM, Beijing 100080, Peoples R China.
Recommended Citation
GB/T 7714
Wei YG,Zhao HF,Wei, YG . Peeling Experiments Of Ductile Thin Films Along Ceramic Substrates - Critical Assessment Of Analytical Models[J]. International Journal of Solids and Structures,2008:3779-3792.
APA 魏悦广,赵海峰,&Wei, YG .(2008).Peeling Experiments Of Ductile Thin Films Along Ceramic Substrates - Critical Assessment Of Analytical Models.International Journal of Solids and Structures,3779-3792.
MLA 魏悦广,et al."Peeling Experiments Of Ductile Thin Films Along Ceramic Substrates - Critical Assessment Of Analytical Models".International Journal of Solids and Structures (2008):3779-3792.
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