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Deflections and curvatures of a film-substrate structure with the presence of gradient stress in MEMS applications
Zhang Y(张吟); Zhang, Y (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, LNM, Beijing 100080, Peoples R China.
Source PublicationJournal of Micromechanics and Microengineering
2007
Volume17Issue:4Pages:753-762
ISSN0960-1317
AbstractThe close form solutions of deflections and curvatures for a film-substrate composite structure with the presence of gradient stress are derived. With the definition of more precise kinematic assumption, the effect of axial loading due to residual gradient stress is incorporated in the governing equation. The curvature of film-substrate with the presence of gradient stress is shown to be nonuniform when the axial loading is nonzero. When the axial loading is zero, the curvature expressions of some structures derived in this paper recover the previous ones which assume the uniform curvature. Because residual gradient stress results in both moment and axial loading inside the film-substrate composite structure, measuring both the deflection and curvature is proposed as a safe way to uniquely determine the residual stress state inside a film-substrate composite structure with the presence of gradient stress.
KeywordThin-films Micromachined Beams Residual-stress Cantilever Beam Stoney Formula Surface Stress Strain Bilayer Systems Model
DOI10.1088/0960-1317/17/4/012
Indexed BySCI
Language英语
WOS IDWOS:000245434200018
WOS KeywordTHIN-FILMS ; MICROMACHINED BEAMS ; RESIDUAL-STRESS ; CANTILEVER BEAM ; STONEY FORMULA ; SURFACE STRESS ; STRAIN ; BILAYER ; SYSTEMS ; MODEL
WOS Research AreaEngineering ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Materials Science ; Mechanics
WOS SubjectEngineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Materials Science, Multidisciplinary ; Mechanics
Citation statistics
Cited Times:10[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/34009
Collection力学所知识产出(1956-2008)
Corresponding AuthorZhang, Y (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, LNM, Beijing 100080, Peoples R China.
Recommended Citation
GB/T 7714
Zhang Y,Zhang, Y . Deflections and curvatures of a film-substrate structure with the presence of gradient stress in MEMS applications[J]. Journal of Micromechanics and Microengineering,2007,17,4,:753-762.
APA 张吟,&Zhang, Y .(2007).Deflections and curvatures of a film-substrate structure with the presence of gradient stress in MEMS applications.Journal of Micromechanics and Microengineering,17(4),753-762.
MLA 张吟,et al."Deflections and curvatures of a film-substrate structure with the presence of gradient stress in MEMS applications".Journal of Micromechanics and Microengineering 17.4(2007):753-762.
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