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Electrical leakage through thin PDMS microchannel walls and its applications
Sun JS; Vajandar SK; Xu DY; Kang YJ; Li DQ; Li DY; Hu GQ(胡国庆); Sun, J.
会议录名称ASME International Mechanical Engineering Congress and Exposition, Proceedings
2009
会议名称2008 ASME International Mechanical Engineering Congress and Exposition, IMECE 2008
会议日期October 31, 2008 - November 6, 2008
会议地点Boston, MA, United states
摘要PDMS is usually considered as a dielectric material and PDMS microchannel walls can be treated as an electrically insulated boundary. However, in certain layouts of microfluidic networks, electrical leakage through PDMS walls could significantly alter the electrical field in the microfluidic circuits, which must be carefully considered in microfluidic circuit design. We report on our experimental characterization of electrical leakage through PDMS microfluidic channel walls. Numerical modeling clearly disclosed the alteration of electrical field and electroosmotic velocity in the microfluidic channels because of the electrical leakage through the thin PDMS wall. In addition, we demonstrate that the electrical leakage through the PDMS channel wall can be used to realize trapping of individual particles at different locations inside the mcirofluidic channel by balancing the electroosmotic flow and electrophoretic migration of the particle. Copyright © 2008 by ASME.
关键词Channel Wall Electrical Field Electrical Leakage Electroosmotic Flow Electroosmotic Velocity Electrophoretic Migration Experimental Characterization Individual Particles Insulated Boundary Microfluidic Channel Microfluidic Circuit Microfluidic Networks Numerical Modeling Pdms Microchannels
WOS记录号WOS:000266546900133
ISBN号9780791848746
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收录类别CPCI-S ; EI
语种英语
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文献类型会议论文
条目标识符http://dspace.imech.ac.cn/handle/311007/60452
专题非线性力学国家重点实验室
通讯作者Sun, J.
推荐引用方式
GB/T 7714
Sun JS,Vajandar SK,Xu DY,et al. Electrical leakage through thin PDMS microchannel walls and its applications[C]ASME International Mechanical Engineering Congress and Exposition, Proceedings,2009.
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