An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes | |
Chen J1; Yang L2; Han Y1; Bao YH3; Zhang KL1![]() ![]() | |
Corresponding Author | Yang, Le([email protected]) ; Chen, Hao-Sen([email protected]) |
Source Publication | JOURNAL OF POWER SOURCES
![]() |
2019-12-31 | |
Volume | 444Pages:5 |
ISSN | 0378-7753 |
Abstract | Here an in situ system is presented to simultaneously study the evolution of both morphology and stress in the silicon thin film electrode during lithiation and delithiation. Owing to the specific design with two observation windows in the in situ cell, both the curvature and color of the silicon thin-film electrodes upon lithiation and delithiation processes can be measured by multi-optical sensor and optical microscope. By such colorimetric method, the color evolution can be used to represent the thickness of silicon thin film electrode, and the quantitative relationship can be obtained by in situ atomic force microscope and optical microscopy experiments. Combining the real thickness with Stoney equation, the accurate stress of the LixSi film can be obtained during the electrochemical cycles. |
Keyword | Lithium ion batteries Silicon film Multi-beam optical sensor (MOS) in situ stress measurement Colorimetric method |
DOI | 10.1016/j.jpowsour.2019.227227 |
Indexed By | SCI ; EI |
Language | 英语 |
WOS ID | WOS:000501401900007 |
WOS Keyword | LITHIUM-ION BATTERIES ; ELECTROCHEMICAL LITHIATION ; FRACTURE ENERGY ; EVOLUTION ; LI ; INTERPHASE |
WOS Research Area | Chemistry ; Electrochemistry ; Energy & Fuels ; Materials Science |
WOS Subject | Chemistry, Physical ; Electrochemistry ; Energy & Fuels ; Materials Science, Multidisciplinary |
Funding Project | National Natural Science Foundation of China[11672341] ; National Natural Science Foundation of China[11572002] ; National Key Research and Development Program of China[2018YFB0104400] ; Innovative Research Groups of the National Natural Science Foundation of China[11521202] ; National Materials Genome Project[2016YFB0700600] ; State Key Laboratory of Explosion Science and Technology[ZDKT18-03] ; Beijing Natural Science Foundation[16L00001] ; Beijing Natural Science Foundation[2182065] |
Funding Organization | National Natural Science Foundation of China ; National Key Research and Development Program of China ; Innovative Research Groups of the National Natural Science Foundation of China ; National Materials Genome Project ; State Key Laboratory of Explosion Science and Technology ; Beijing Natural Science Foundation |
Classification | 一类 |
Ranking | 5+ |
Contributor | Yang, Le ; Chen, Hao-Sen |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://dspace.imech.ac.cn/handle/311007/81215 |
Collection | 非线性力学国家重点实验室 |
Affiliation | 1.Beijing Inst Technol, Inst Adv Struct Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China; 2.Tsinghua Univ, AML, CNMM, Dept Engn Mech, Beijing 100084, Peoples R China; 3.Peking Univ, Coll Engn, State Key Lab Turbulence & Complex Syst, Beijing 100871, Peoples R China; 4.China Automot Battery Res Inst Co Ltd, Beijing 100088, Peoples R China; 5.Chinese Acad Sci, Inst Mech, LNM, Beijing 100190, Peoples R China |
Recommended Citation GB/T 7714 | Chen J,Yang L,Han Y,et al. An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes[J]. JOURNAL OF POWER SOURCES,2019,444:5.Rp_Au:Yang, Le, Chen, Hao-Sen |
APA | Chen J.,Yang L.,Han Y.,Bao YH.,Zhang KL.,...&Fang DN.(2019).An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes.JOURNAL OF POWER SOURCES,444,5. |
MLA | Chen J,et al."An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes".JOURNAL OF POWER SOURCES 444(2019):5. |
Files in This Item: | Download All | |||||
File Name/Size | DocType | Version | Access | License | ||
Jp2019450.pdf(774KB) | 期刊论文 | 出版稿 | 开放获取 | CC BY-NC-SA | View Download |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment