Scaling Effects in the Mechanical System of the Flexible Epidermal Electronics and the Human Skin | |
Liu GD(刘国栋)1,2; Sun LJ(孙立娟)1,2![]() | |
Source Publication | JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME
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2020-08-01 | |
Volume | 87Issue:8Pages:6 |
ISSN | 0021-8936 |
Abstract | The "island-bridge" mesh structure is widely adopted for flexible epidermal electronics to simultaneously achieve the electronic functions and mechanical flexibility. Mechanical intuition tells that the small size of the "island" is beneficial to the flexibility of the structure and the adaptability to complex geometric targets. Here, a plane-strain model and an axisymmetric model are established for square "island" and cycle "island," respectively, to analyze the mechanical system consisting of the flexible epidermal electronics and the human skin. It is found that the pressure between the "island" and the human skin is positive at the inner region and reaches a peak value at the center, while is negative at the outer region and approaches infinite at the boundary of the contact region. With the increase in the size a/R-0, the amplitude of the pressure significantly increases, as well as the singular degree of the pressure at the boundary. The reduction of the "island" size is beneficial for the optimization of the "comfort level" of the flexible epidermal electronics. The models degenerate into the famous Johnson-Kendall-Roberts (JKR) model for the limit case with extremely hard and thick "island." |
Keyword | flexible electronics epidermal electronics size effect JKR model elasticity structures |
DOI | 10.1115/1.4047039 |
Indexed By | SCI ; EI |
Language | 英语 |
WOS ID | WOS:000554443100007 |
WOS Keyword | SENSORS |
WOS Research Area | Mechanics |
WOS Subject | Mechanics |
Funding Project | National Natural Science Foundation of China[11772331] ; National Natural Science Foundation of China[11572323] ; Beijing Municipal Science and Technology Commission[Z191100002019010] ; Beijing Municipal Natural Science Foundation[2202066] ; Key Research Program of Frontier Sciences of the Chinese Academy of Sciences[ZDBS-LY-JSC014] ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB22040501] ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology[GZ19102] |
Funding Organization | National Natural Science Foundation of China ; Beijing Municipal Science and Technology Commission ; Beijing Municipal Natural Science Foundation ; Key Research Program of Frontier Sciences of the Chinese Academy of Sciences ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology |
Classification | 一类/力学重要期刊 |
Ranking | 1 |
Contributor | Su YW(苏业旺) |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://dspace.imech.ac.cn/handle/311007/84837 |
Collection | 非线性力学国家重点实验室 |
Affiliation | 1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China; 2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China; 3.Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China |
Recommended Citation GB/T 7714 | Liu GD,Sun LJ,Su YW. Scaling Effects in the Mechanical System of the Flexible Epidermal Electronics and the Human Skin[J]. JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME,2020,87,8,:6.Rp_Au:Su YW(苏业旺) |
APA | Liu GD,Sun LJ,&Su YW.(2020).Scaling Effects in the Mechanical System of the Flexible Epidermal Electronics and the Human Skin.JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME,87(8),6. |
MLA | Liu GD,et al."Scaling Effects in the Mechanical System of the Flexible Epidermal Electronics and the Human Skin".JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME 87.8(2020):6. |
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