Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors | |
Li S(李爽)1,2; Liu GD(刘国栋)1,2; Wang LW3; Fang GH3; Su YW(苏业旺)1,2,4 | |
Corresponding Author | Su, Yewang([email protected]) |
Source Publication | ADVANCED ELECTRONIC MATERIALS
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2020-09-13 | |
Pages | 6 |
ISSN | 2199-160X |
Abstract | Stretchable strain sensors have recently attracted great attention due to their extensive applications in advanced devices. Plenty of work has been devoted to enlarging the gauge factor (GF) (reaching as high as 10(7)), since the conventional wisdom holds that a high GF indicates a low limit of detection and a high resolution of a sensor. Here, the effects of the GF on the measurement accuracy is investigated for resistive-type strain sensors, via the basic approach based on Ohm's law and the commonly used method of Wheatstone bridge, respectively. It is found that a bigger GF is not always better for improvement of the measurement accuracy, which is contrary to conventional wisdom. Overlarge gauge factor yields a large measuring error for resistive-type stretchable strain sensors (reaching the measuring error of 50% for GF = 5 x 10(4)under a typical measurement condition). This finding is of much significance for providing theoretical guidance for the sensor design and avoid more efforts on overlarge GF. |
Keyword | gauge factor stretchable strain sensors wearable electronics |
DOI | 10.1002/aelm.202000618 |
Indexed By | SCI ; EI |
Language | 英语 |
WOS ID | WOS:000568703400001 |
WOS Keyword | SKIN |
WOS Research Area | Science & Technology - Other Topics ; Materials Science ; Physics |
WOS Subject | Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied |
Funding Project | National Natural Science Foundation of China[11772331] ; National Natural Science Foundation of China[11572323] ; Beijing Municipal Science and Technology Commission[Z191100002019010] ; Beijing Municipal Natural Science Foundation[2202066] ; Key Research Program of Frontier Sciences Chinese Academy of Sciences[ZDBS-LY-JSC014] ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB22040501] ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology[GZ19102] |
Funding Organization | National Natural Science Foundation of China ; Beijing Municipal Science and Technology Commission ; Beijing Municipal Natural Science Foundation ; Key Research Program of Frontier Sciences Chinese Academy of Sciences ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology |
Classification | 二类/Q1 |
Ranking | 1 |
Contributor | Su, Yewang |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://dspace.imech.ac.cn/handle/311007/85202 |
Collection | 非线性力学国家重点实验室 |
Affiliation | 1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China; 2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China; 3.Beijing Inst Space Mech & Elect, Beijing 100094, Peoples R China; 4.Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China |
Recommended Citation GB/T 7714 | Li S,Liu GD,Wang LW,et al. Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors[J]. ADVANCED ELECTRONIC MATERIALS,2020:6.Rp_Au:Su, Yewang |
APA | 李爽,刘国栋,Wang LW,Fang GH,&苏业旺.(2020).Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors.ADVANCED ELECTRONIC MATERIALS,6. |
MLA | 李爽,et al."Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors".ADVANCED ELECTRONIC MATERIALS (2020):6. |
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