IMECH-IR  > 非线性力学国家重点实验室
Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors
Li S(李爽)1,2; Liu GD(刘国栋)1,2; Wang LW3; Fang GH3; Su YW(苏业旺)1,2,4
Corresponding AuthorSu, Yewang([email protected])
Source PublicationADVANCED ELECTRONIC MATERIALS
2020-09-13
Pages6
ISSN2199-160X
AbstractStretchable strain sensors have recently attracted great attention due to their extensive applications in advanced devices. Plenty of work has been devoted to enlarging the gauge factor (GF) (reaching as high as 10(7)), since the conventional wisdom holds that a high GF indicates a low limit of detection and a high resolution of a sensor. Here, the effects of the GF on the measurement accuracy is investigated for resistive-type strain sensors, via the basic approach based on Ohm's law and the commonly used method of Wheatstone bridge, respectively. It is found that a bigger GF is not always better for improvement of the measurement accuracy, which is contrary to conventional wisdom. Overlarge gauge factor yields a large measuring error for resistive-type stretchable strain sensors (reaching the measuring error of 50% for GF = 5 x 10(4)under a typical measurement condition). This finding is of much significance for providing theoretical guidance for the sensor design and avoid more efforts on overlarge GF.
Keywordgauge factor stretchable strain sensors wearable electronics
DOI10.1002/aelm.202000618
Indexed BySCI ; EI
Language英语
WOS IDWOS:000568703400001
WOS KeywordSKIN
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Physics
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
Funding ProjectNational Natural Science Foundation of China[11772331] ; National Natural Science Foundation of China[11572323] ; Beijing Municipal Science and Technology Commission[Z191100002019010] ; Beijing Municipal Natural Science Foundation[2202066] ; Key Research Program of Frontier Sciences Chinese Academy of Sciences[ZDBS-LY-JSC014] ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB22040501] ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology[GZ19102]
Funding OrganizationNational Natural Science Foundation of China ; Beijing Municipal Science and Technology Commission ; Beijing Municipal Natural Science Foundation ; Key Research Program of Frontier Sciences Chinese Academy of Sciences ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology
Classification二类/Q1
Ranking1
ContributorSu, Yewang
Citation statistics
Cited Times:15[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/85202
Collection非线性力学国家重点实验室
Affiliation1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China;
2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China;
3.Beijing Inst Space Mech & Elect, Beijing 100094, Peoples R China;
4.Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China
Recommended Citation
GB/T 7714
Li S,Liu GD,Wang LW,et al. Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors[J]. ADVANCED ELECTRONIC MATERIALS,2020:6.Rp_Au:Su, Yewang
APA 李爽,刘国栋,Wang LW,Fang GH,&苏业旺.(2020).Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors.ADVANCED ELECTRONIC MATERIALS,6.
MLA 李爽,et al."Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors".ADVANCED ELECTRONIC MATERIALS (2020):6.
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