| SINGLE ION DETECTION METHOD AND DEVICE | |
Liu W(刘巍) ; Niu Y(牛宇); Luo ZR(罗子人)
| |
| 2023-09-29 | |
| Rights Holder | 中国科学院力学研究所 |
| Abstract | A single ion imaging-based detection method and a device. The method comprises: after being reflected by an electrically modulated singularity coupled differential imaging response unit (2), a detection beam of a total internal reflection ellipsometer (1) converges on a CCD or CMOS detector; the acquired sensing surface image data is transmitted to a signal processing unit (4); by performing spectral analysis of differential signals of a working sensing surface and reference sensing surface, common mode noise is eliminated; the peak intensity of a modulated signal is selected on the spectrum for wave filtering, so as to obtain a real-time signal of an interaction between a single ion or a charged molecule at a solid-liquid interface. On the basis of the singularity effect at a surface plasma resonance angle on an ellipsometry phase and a corresponding optical signal noise suppression solution, real-time observation of the adsorption of a single ion or a charged molecule at a solid surface and a physicochemical reaction thereof can be achieved. |
| Application Date | 2022-03-22 |
| Application Number | WOCN22082157 |
| Patent Number | WO2022199563A1 |
| Claim | A single ion imaging detection method, wherein it comprises the following steps: (1) the signal generator applies a high-frequency sinusoidal modulation signal to the working sensing surface of the electric modulation odd-point-coupling differential imaging reaction unit; (2) total internal reflection ellipsometric imaging instrument of the detection beam, after the electric modulation odd point coupling the differential imaging reaction unit is reflected, collecting the detector of total internal reflection ellipsometry imaging instrument; (3) transmitting the sensing surface image data collected by the CCD or CMOS detector to the signal processing unit; (4) the signal processing unit by selecting the electric modulation odd point coupling the differential imaging reaction unit working sensing surface and the reference sensing surface same size of the area image, working area signal intensity I0 (t obtain and the average value in the specific integration time, and reference region signal strength Ir (t) and average value thereof from inverting to obtain single ion or charged molecular differential signal S at the solid-liquid interface of the sensing surface of the reaction unit, performing Fourier transform on the differential signal S, selecting the peak value of the modulation signal on the spectrum to filter and reduce noise. The single ion imaging detection method according to Claim 1, wherein in the step (1), the micro-channel unit transmits the solution containing the target ion and the reference solution to the electro-modulation odd-point coupling the differential imaging reaction unit. A single ion imaging detection device, using the single ion imaging detection method according to Claim 1 or 2, comprising a total internal reflection ellipsometry imaging device, wherein it further comprises an electric modulation odd point coupling differential imaging reaction unit, a signal generator and a signal processing unit; the total internal reflection ellipsometry imager generates a detection beam, and obtains real-time image data of single ion or charged molecule interaction on the sensing surface solid-liquid interface; the electric modulation odd point coupling the differential imaging reaction unit in the surface plasma resonance angle neighbourhood, ellipsometric phase change odd point near the obtaining working unit and the reference unit of the real-time signal; the positive electrode generator is connected with the working unit sensing surface, the negative electrode is connected with the platinum wire of the working unit, the sine modulation signal is applied on the surface of the working unit through the signal generator; the signal processing unit performs differential frequency spectrum analysis on the working sensing surface of the collected odd-point coupling differential imaging reaction unit and the optical image signal of the reference sensing surface, inverting to obtain the solid-liquid interface single ion and the charged molecular materialization reaction information. The single ion imaging detection device according to Claim 3, wherein the electric modulation odd-point coupling difference imaging reaction unit, comprising a tilt angle is a detection beam surface plasma resonance angle of coupling prism, total internal reflection sensing substrate, and a differential imaging reaction unit, the reflecting surface of the coupling prism and the total internal reflection sensing substrate of the glass substrate, The film coating layer of the total internal reflection sensing substrate and the difference imaging reaction unit contact. The single ion imaging detection device according to Claim 4, wherein the coupling prism for 633nm incident detection beam, prism angle is about 58 degrees. The single ion imaging detection device according to Claim 4, wherein the differential imaging reaction unit at least comprises two independent reaction chambers, the diameters of the two independent reaction chambers are set to be 5 mm, the distance between two chambers of the two independent reaction chambers is less than or equal to 1 mm, a reaction chamber is used as the working unit, and the other reaction chamber is used as the reference unit. The single ion imaging detection device according to Claim 4, wherein the total internal reflection sensing substrate is divided along the central line, the total internal reflection sensing substrate is divided into two substrate surfaces, wherein one is the working surface, and the other one is the reference surface. The single ion imaging detection device according to Claim 3, wherein comprising a micro-flow channel unit, the micro-flow channel unit transmits the solution containing target ion to the working induction surface of the electric modulation odd-point coupling the differential imaging reaction unit, and the reference solution is transported to the reference sensing surface. The single ion imaging detection device according to Claim 3, wherein comprising a noise isolation system, the total internal reflection ellipsometry imaging instrument and the odd point coupling difference imaging reaction unit are assembled in the noise isolation system. |
| Language | 英语 |
| Classification | 发明申请 |
| Status | 有效 |
| Note | PCT进入指定国(指定期满) |
| Country | 世界 |
| Agency | 北京和信华成知识产权代理事务所 |
| Document Type | 专利 |
| Identifier | http://dspace.imech.ac.cn/handle/311007/93941 |
| Collection | 微重力重点实验室 |
| Recommended Citation GB/T 7714 | Liu W,Niu Y,Luo ZR. SINGLE ION DETECTION METHOD AND DEVICE. WO2022199563A1[P]. 2023-09-29. |
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| 11808695.pdf（526KB） | 专利 | 开放获取 | CC BY-NC-SA | View Download | ||
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