Image Reconstruction in Open-EIT by Combining Inversion Mapping and Sparse Contour Representation | |
Shen, Mengxian; Sun, Jiangtao; Suo, Peng; Wang ZY(王志英); Wang, Yadong; Tian, Wenbin; Li, Changwen; Xu, Lijun | |
Source Publication | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
2024 | |
Volume | 73Pages:4502209 |
ISSN | 0018-9456 |
Abstract | This article presents an image reconstruction method for open electrical impedance tomography (OEIT) combined with inversion mapping and contour representation to address the profile and medium distribution measurement requirements of adhesion cavitation. Electrodes are arranged on the surface of an axisymmetric blunt body to form the Open-EIT sensor. To guarantee the accuracy of forward modeling in image reconstruction, the infinite domain outside the sensor is transformed into a disk by an equivalent dedicated inversion mapping. Then, the cavity contour is obtained using a customized B-spline-based sparse reconstruction method. Finally, the medium distribution to be reconstructed is confined within the contour to improve the imaging speed and resolution, which is then mapped back to the original infinity domain. Theoretical analysis and simulation demonstrate that the forward model maintains physical consistency after the inversion mapping, and the detection sensitivity is nearly ten times higher than that before the mapping. Simulations and experiments were conducted to verify the effectiveness of the proposed method, where the contour and its inside distribution can be better reconstructed in each specified case compared to other typical methods. The aforementioned method establishes a viable and effective approach for monitoring the cavitation occurrence on the surface of underwater vehicles. |
Keyword | Image reconstruction Sensors Electrodes Surface reconstruction Electrical impedance tomography Reconstruction algorithms Mathematical models B-spline representation cavitation measurement inversion mapping open electrical impedance tomography (OEIT) region of interest (ROI) sparse reconstruction |
DOI | 10.1109/TIM.2024.3351266 |
Indexed By | SCI ; EI |
Language | 英语 |
WOS ID | WOS:001166660300021 |
WOS Research Area | Engineering ; Instruments & Instrumentation |
WOS Subject | Engineering, Electrical & Electronic ; Instruments & Instrumentation |
Funding Organization | National Natural Science Foundation of China |
Classification | 一类 |
Ranking | 3+ |
Contributor | Sun JT ; Tian WB |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://dspace.imech.ac.cn/handle/311007/97171 |
Collection | 流固耦合系统力学重点实验室 |
Affiliation | 1.【Shen, Mengxian & Sun, Jiangtao & Suo, Peng & Xu, Lijun】 Beihang Univ, Sch Instrumentat & Optoelect Engn, Beijing 100191, Peoples R China 2.【Wang, Zhiying】 Chinese Acad Sci, Key Lab Mech Fluid Solid Coupling Syst, Inst Mech, Beijing 100049, Peoples R China 3.【Wang, Yadong & Li, Changwen】 Beijing Inst Mech & Elect Engn, Beijing 100000, Peoples R China 4.【Tian, Wenbin】 China Agr Univ, Coll Engn, Beijing 100083, Peoples R China |
Recommended Citation GB/T 7714 | Shen, Mengxian,Sun, Jiangtao,Suo, Peng,et al. Image Reconstruction in Open-EIT by Combining Inversion Mapping and Sparse Contour Representation[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2024,73:4502209.Rp_Au:Sun JT, Tian WB |
APA | Shen, Mengxian.,Sun, Jiangtao.,Suo, Peng.,王志英.,Wang, Yadong.,...&Xu, Lijun.(2024).Image Reconstruction in Open-EIT by Combining Inversion Mapping and Sparse Contour Representation.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,73,4502209. |
MLA | Shen, Mengxian,et al."Image Reconstruction in Open-EIT by Combining Inversion Mapping and Sparse Contour Representation".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 73(2024):4502209. |
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