IMECH-IR  > 微重力重点实验室
Single ion detection method and device
Liu W(刘巍); Niu Y(牛宇); Luo ZR(罗子人)
2023-11-07
Rights HolderINSTITUTE OF MECHANICS, CHINESE ACADEMY OF SCIENCES
AbstractA single ion imaging-based detection method and device are provided. After being reflected by an electromodulation singularity coupling differential imaging reaction unit, a probe beam from a total internal reflection ellipsometry imager converges on a CCD or CMOS detector, the acquired sensing surface image data is transmitted to a signal processing unit, the common mode noise is eliminated by performing spectral analysis on differential signals of a working sensing surface and a reference sensing surface, the peak intensity of a modulating signal is selected on the spectrum for wave filtering to obtain a real-time signal of interaction of single ions or charged molecules at a solid-liquid interface. Based on the singularity effect at a surface plasma resonance angle of an ellipsometry phase and a corresponding optical signal noise suppression scheme, the present application can achieve real-time observation of the adsorption of single ions or charged molecules at a solid surface.
Application Date2022-03-22
Application NumberUS18019485
Patent NumberUS11808695B2
Claim1. A single ion imaging detection method, comprising: (1) applying, by a signal generator (3), a high-frequency sinusoidal modulating signal to a working sensing surface (W1) of an electromodulation singularity coupling differential imaging reaction unit (2), wherein the signal generator comprises a positive pole (31) connected to a sensing surface (W1) of a working unit (21) and a negative pole (32) connected to a platinum wire counter electrode (22) of the working unit and is configured to apply a sinusoidal modulating signal to the surface of the working unit; (2) after a probe beam from a total internal reflection ellipsometry imager (1) is reflected by the electromodulation singularity coupling differential imaging reaction unit (2), converging the probe beam on a detector of the total internal reflection ellipsometry imager (1), (3) transmitting sensing surface image data acquired via a CCD or CMOS detector to a signal processing unit (4), and (4) selecting, by the signal processing unit (4), area images of a same size on the working sensing surface and a reference sensing surface (R2) in the electromodulation singularity coupling differential imaging reaction unit (2), so as to obtain a working area signal intensity I0(t) and its mean value Ī0, a reference area signal intensity Ir(t) and its mean value Īr within a specific integration time, carrying out a S=I0(t)-I0_Ir_⁢(Ir⁢(t)-Ir_)  inversion to calculate a differential signal S of a single ion or a charged molecule at a solid-liquid interface on the working sensing surface (W1) of the electromodulation singularity coupling differential imaging reaction unit, carrying out a Fourier transform on the differential signal S, and selecting a peak of a modulating signal on a spectrum for filtering and a noise reduction.
Language英语
Classification发明授权
Status有效
Note授权
Country美国
Agency北京和信华成知识产权代理事务所
Document Type专利
Identifierhttp://dspace.imech.ac.cn/handle/311007/99969
Collection微重力重点实验室
Recommended Citation
GB/T 7714
Liu W,Niu Y,Luo ZR. Single ion detection method and device. US11808695B2[P]. 2023-11-07.
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