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中国科学院力学研究所机构知识库
Knowledge Management System of Institue of Mechanics, CAS
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An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes
期刊论文
JOURNAL OF POWER SOURCES, 2019, 卷号: 444, 页码: 5./通讯作者:Yang, Le, Chen, Hao-Sen
Authors:
Chen J
;
Yang L
;
Han Y
;
Bao YH
;
Zhang KL
;
Li X
;
Pang J
;
Chen HS
;
Song WL
;
Wei YJ(魏宇杰)
;
Fang DN
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View/Download:589/217
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Submit date:2020/03/11
Lithium ion batteries
Silicon film
Multi-beam optical sensor (MOS)
in situ stress measurement
Colorimetric method
Electrical insulation and bending properties of SiO(x) barrier layers prepared on flexible stainless steel foils by different preparing methods
期刊论文
Thin Solid Films, 2011, 卷号: 519, 期号: 13, 页码: 4234-4238
Authors:
Li YQ(李玉琼)
;
Yu ZN
;
Leng J
;
Zhang DP
;
Chen S(陈涉)
;
Jin G(靳刚)
;
Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, Beijing 100190, Peoples R China, Peoples R China
Adobe PDF(935Kb)
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View/Download:892/286
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Submit date:2012/04/01
Silicon Oxide
Dielectric Barriers
Electrical Insulation
Bending Resistance
Stainless Steel Foils
Film Solar-cells
Efficiency
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