Multi-Scale Characterizations for Ductile Thin Film Delamination

IMECH-IR > 力学所知识产出(1956-2008)

	Multi-Scale Characterizations for Ductile Thin Film Delamination
	Wei YG(魏悦广); Xu GS
会议录名称	IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales Book Series: SOLID MECHANICS AND ITS APPLICATIONS Volume: 142 Pages: 13-22 Published: 2006
	2004-05-31
会议名称	IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales, MAY 31-JUN 04, 2004 Hong Kong Univ Sci & Technol, Hong Kong, PEOPLES R CHINA
WOS记录号	WOS:000241440600002
收录类别	CPCI-S
语种	英语
引用统计
文献类型	会议论文
条目标识符	http://dspace.imech.ac.cn/handle/311007/13775
专题	力学所知识产出(1956-2008)
通讯作者	Wei YG(魏悦广)
推荐引用方式 GB/T 7714	Wei YG,Xu GS. Multi-Scale Characterizations for Ductile Thin Film Delamination[C]IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales Book Series: SOLID MECHANICS AND ITS APPLICATIONS Volume: 142 Pages: 13-22 Published: 2006,2004.