Multi-Scale Characterizations for Ductile Thin Film Delamination

IMECH-IR > 力学所知识产出(1956-2008)

	Multi-Scale Characterizations for Ductile Thin Film Delamination
	Wei YG(魏悦广); Xu GS
Source Publication	IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales Book Series: SOLID MECHANICS AND ITS APPLICATIONS Volume: 142 Pages: 13-22 Published: 2006
	2004-05-31
Conference Name	IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales, MAY 31-JUN 04, 2004 Hong Kong Univ Sci & Technol, Hong Kong, PEOPLES R CHINA
WOS ID	WOS:000241440600002
Indexed By	CPCI-S
Language	英语
Citation statistics
Document Type	会议论文
Identifier	http://dspace.imech.ac.cn/handle/311007/13775
Collection	力学所知识产出(1956-2008)
Corresponding Author	Wei YG(魏悦广)
Recommended Citation GB/T 7714	Wei YG,Xu GS. Multi-Scale Characterizations for Ductile Thin Film Delamination[C]IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales Book Series: SOLID MECHANICS AND ITS APPLICATIONS Volume: 142 Pages: 13-22 Published: 2006,2004.

Related Services

Bookmark

Lanfanshu

Similar articles in Bing Scholar

Terms of Use

No data!

Social Bookmark/Share

File name:	978-1-4020-4946-0_2.pdf
Format:	Adobe PDF

This file does not support browsing at this time

All comments (0)

No comment.

The comment function is only available to registered usersLog In

If you have any objections to this item, please fill out the form below and the administrator will contact you as soon as possible.
Content:
Email：	*
Institution:
Verification Code:	Refresh

Any comments and suggestions are welcomed.
Title:	*
Content:
Email：	*
Verification Code:	Refresh

中国科学院力学研究所机构知识库