Knowledge Management System of Institue of Mechanics, CAS
| Equivalency and Locality in Nano-Scale Measurement | |
Hu M(胡明) ; Wang HY(汪海英); Bai YL(白以龙); Xia MF(夏蒙棼); Ke FJ(柯孚久); Hu, M (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China.
| |
| Source Publication | International Journal of Nonlinear Sciences and Numerical Simulation
 |
| 2005 | |
| Volume | 6Issue:3Pages:235-242 |
| ISSN | 1565-1339 |
| Abstract | Two principal problems of equivalency and locality in nano-scale measurement are considered in this paper. The conventional measurements of force and displacement are always closely related to the equivalency problem between the measuremental results by experimental system and the real physical status of the sample, and the locality of the mechanical quantities to be measured. There are some noticeable contradictions in nano-scale measurements induced by the two problems. In this paper, by utilizing a coupled molecular-continuum method, we illustrate the important effects of the two principal problems in atomic force microscopy (AFM) measurements on nano-scale. Our calculations and analysis of these typical mechanical measurement problems suggest that in nano-meter scale measurements, the two principal problems must be carefully dealt with. The coupled molecular-continuum method used in this paper is very effective in solving these problems on nano-scale. |
| Subject Area | 力学 |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000230059700004 |
| WOS Keyword | ATOMIC-FORCE MICROSCOPE ; HAMAKER CONSTANTS ; SIMULATION ; SYSTEMS ; SURFACE ; WATER ; MICA |
| WOS Research Area | Engineering ; Mathematics ; Mechanics ; Physics |
| WOS Subject | Engineering, Multidisciplinary ; Mathematics, Applied ; Mechanics ; Physics, Mathematical |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://dspace.imech.ac.cn/handle/311007/17472 |
| Collection | 力学所知识产出(1956-2008) |
| Corresponding Author | Hu, M (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China. |
| Recommended Citation GB/T 7714 | Hu M,Wang HY,Bai YL,et al. Equivalency and Locality in Nano-Scale Measurement[J]. International Journal of Nonlinear Sciences and Numerical Simulation,2005,6,3,:235-242. |
| APA | 胡明,汪海英,白以龙,夏蒙棼,柯孚久,&Hu, M .(2005).Equivalency and Locality in Nano-Scale Measurement.International Journal of Nonlinear Sciences and Numerical Simulation,6(3),235-242. |
| MLA | 胡明,et al."Equivalency and Locality in Nano-Scale Measurement".International Journal of Nonlinear Sciences and Numerical Simulation 6.3(2005):235-242. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Equivalency%20and%20（548KB） | 开放获取 | -- | View Application Full Text | |||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment