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Contact dynamics of tapping mode atomic force microscopy
Zhang Y(张吟); Zhao HS(赵海盛); Zhuo LJ(卓立军); Zhang, Y; Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China.
Source PublicationJOURNAL OF SOUND AND VIBRATION
2012-11-05
Volume331Issue:23Pages:5141-5152
ISSN0022-460X
AbstractA comprehensive model on the dynamics of a tilted tapping mode atomic force microscopy (AFM) is presented, which includes the multimodal analysis, mode coupling mechanisms, adhesion, contact and friction forces induced by the tilting angle. A displacement criterion of contact/impact is proposed to eliminate the assumptions of the previous models such as infinite stiffness of sample or zero impact velocity, which makes the model presented here suitable for more general AFM application scenario, especially for the soft sample case. The AFM tip mass, tip-sample damping, contact forces and intermittent contact can all induce the higher modes participation into the system motion. One degree of freedom or one mode study on the AFM contact dynamics of tapping mode is shown to be inaccurate. The Hertz and Derjaguin-Muller-Toporov models are used for the comparison study of the non-adhesive and adhesive contacts. The intermittent contact and the contact forces are the two major sources of the system nonlinearity. The rich dynamic responses of the system and its sensitivity to the initial conditions are demonstrated by presenting various subharmonic and nonperiodic motions.
KeywordTip-sample Interaction Frequency-shifts Higher-harmonics Spectroscopy Modulation Resolution Oscillator Friction Contrast Behavior
Subject Area非线性振动与控制
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Indexed BySCI ; EI
Language英语
WOS IDWOS:000308383000011
Funding OrganizationThe research has been supported by the National Natural Science Foundation of China (NSFC Nos. 11021262 and 11023001) and Chinese Academy of Sciences (Grant no. KJCX2-EW-L03).
DepartmentLNM纳/微系统力学与物理力学
Classification二类
Citation statistics
Cited Times:11[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/46675
Collection非线性力学国家重点实验室
Corresponding AuthorZhang, Y; Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China.
Recommended Citation
GB/T 7714
Zhang Y,Zhao HS,Zhuo LJ,et al. Contact dynamics of tapping mode atomic force microscopy[J]. JOURNAL OF SOUND AND VIBRATION,2012,331,23,:5141-5152.
APA 张吟,赵海盛,卓立军,Zhang, Y,&Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China..(2012).Contact dynamics of tapping mode atomic force microscopy.JOURNAL OF SOUND AND VIBRATION,331(23),5141-5152.
MLA 张吟,et al."Contact dynamics of tapping mode atomic force microscopy".JOURNAL OF SOUND AND VIBRATION 331.23(2012):5141-5152.
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