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Image Reconstruction in Open-EIT by Combining Inversion Mapping and Sparse Contour Representation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 卷号: 73, 页码: 4502209./通讯作者：Sun JT, Tian WB
Authors:  Shen, Mengxian;  Sun, Jiangtao;  Suo, Peng;  Wang ZY(王志英);  Wang, Yadong;  Tian, Wenbin;  Li, Changwen;  Xu, Lijun
Favorite  |  View/Download：2/0  |  Submit date：2024/12/02
Image reconstruction  Sensors  Electrodes  Surface reconstruction  Electrical impedance tomography  Reconstruction algorithms  Mathematical models  B-spline representation  cavitation measurement  inversion mapping  open electrical impedance tomography (OEIT)  region of interest (ROI)  sparse reconstruction